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Of interest... |
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Free Books! |
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I have a number of books that need to be reviewed. If you have interest and some knowledge in the topic, let me know. I will send you the book — which you will be able to keep — and expect in return a review for the Newsletter. If you think you might like to review a book, but need more information, just go to the web site of the publisher or a web book seller to see more book detail.
Below are some of the books I'd appreciate help reviewing. If interested, Please email me at logorman@avaya.com,
Larry O’Gorman, IAPR Newsletter Editor
Bézier and Splines in Image Processing and Machine Vision, Sambhunath Biswas and Brian C. Lovell (Springer, Dec 2007)
Digital Signal Processing: An Experimental Approach (Signals and Communication Technology), Shlomo Engelberg (Springer- Feb 2008)
Machine Learning in Document Analysis and Recognition (Studies in Computational Intelligence), Simone Marinai and Hiromichi Fujisawa (Springer - Feb 2008)
Pattern Recognition and Neural Networks, Brian D. Ripley (Cambridge - Feb 2008)
Probability and Computing: Randomized Algorithms and Probabilistic Analysis, Michael Mitzenmacher and Eli Upfal (Cambridge - Jan 2005) |
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Calls for Submissions... |
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Call for Submissions to a special issue:
Machine Vision and Applications Journal— Integrated Imaging and Vision Techniques for Industrial Inspection
Deadline for submission: August 31, 2008
Imaging- and vision-based techniques play an important role in industrial inspection. The sophistication of the techniques assures high-quality performance of the manufacturing process through precise positioning, online monitoring, and real-time classification. Advanced systems incorporating multiple imaging and/or vision modalities provide robust solutions to complex situations and problems in industrial applications. A diverse range of industries, including aerospace, automotive, electronics, pharmaceutical, biomedical, semiconductor, and food/beverage, etc., have benefited from recent advances in multi-modal imaging, data fusion, and computer vision technologies. The purpose of this special issue is to highlight such advances and demonstrate the successful applications of multi-modal imaging and vision technologies in industrial inspection. Papers that advance the theories of multi-modal imaging, data fusion, and vision techniques or tackle challenges in practical applications are invited. In addition to conventional vision technologies, imaging modalities of interest include X-ray , Terahertz imaging, and ultrasonic testing. The contributions should be original and must not have been presented and/or published (or currently under consideration) in any other form. Machine Vision and Applications accepts high-quality technical contributions which are within its aims and scope in both long and short paper formats. Long papers may not be over 30 manuscript pages in length (12 point type, double-spaced, 5 cm margins (2 inch) on one side of the paper only) including figures, references, acknowledgements, footnotes, tables, and captions. All papers should be written in English. Further guidelines can be viewed at http://www.springerlink.com/content/100522/. . GUEST EDITORS
Submitting Your Manuscript Machine Vision and Applications employs a completely automated submission and review process. To submit a For further information regarding Machine Vision and Applications, please contact: Sheli Carr, Editorial Coordinator mva_ec@bellsouth.net |